%0 Journal Article %1 journals/dt/DenkingerPBBBRQ20 %A Denkinger, Benoît W. %A Ponzina, Flavio %A Basu, Soumya %A Bonetti, Andrea %A Balási, Szabolcs %A Ruggiero, Martino %A Quirós, Miguel Peón %A Rossi, Davide %A Burg, Andreas %A Atienza, David %D 2020 %J IEEE Des. Test %K dblp %N 2 %P 84-92 %T Impact of Memory Voltage Scaling on Accuracy and Resilience of Deep Learning Based Edge Devices. %U http://dblp.uni-trier.de/db/journals/dt/dt37.html#DenkingerPBBBRQ20 %V 37

@article{journals/dt/DenkingerPBBBRQ20, added-at = {2020-06-16T00:00:00.000+0200}, author = {Denkinger, Benoît W. and Ponzina, Flavio and Basu, Soumya and Bonetti, Andrea and Balási, Szabolcs and Ruggiero, Martino and Quirós, Miguel Peón and Rossi, Davide and Burg, Andreas and Atienza, David}, biburl = {https://www.bibsonomy.org/bibtex/2a649ef0cfb911768e0a5400ca6ba55f3/dblp}, ee = {https://doi.org/10.1109/MDAT.2019.2947282}, interhash = {65e17174e5e8e64d57babe7629434ca2}, intrahash = {a649ef0cfb911768e0a5400ca6ba55f3}, journal = {IEEE Des. Test}, keywords = {dblp}, number = 2, pages = {84-92}, timestamp = {2020-06-17T11:49:01.000+0200}, title = {Impact of Memory Voltage Scaling on Accuracy and Resilience of Deep Learning Based Edge Devices.}, url = {http://dblp.uni-trier.de/db/journals/dt/dt37.html#DenkingerPBBBRQ20}, volume = 37, year = 2020 }