%0 Journal Article %1 journals/ress/OhCKYP15 %A Oh, Hyun-Seok %A yun Choi, Seung %A Kim, Keunsu %A Youn, Byeng D. %A Pecht, Michael G. %D 2015 %J Reliab. Eng. Syst. Saf. %K dblp %P 92-99 %T An empirical model to describe performance degradation for warranty abuse detection in portable electronics. %U http://dblp.uni-trier.de/db/journals/ress/ress142.html#OhCKYP15 %V 142

@article{journals/ress/OhCKYP15, added-at = {2021-04-09T00:00:00.000+0200}, author = {Oh, Hyun-Seok and yun Choi, Seung and Kim, Keunsu and Youn, Byeng D. and Pecht, Michael G.}, biburl = {https://www.bibsonomy.org/bibtex/297f9705b70ef7a63d45e50164c6b45a3/dblp}, ee = {https://doi.org/10.1016/j.ress.2015.04.019}, interhash = {66b33093abc8ba33f94e162003b4ae49}, intrahash = {97f9705b70ef7a63d45e50164c6b45a3}, journal = {Reliab. Eng. Syst. Saf.}, keywords = {dblp}, pages = {92-99}, timestamp = {2024-04-08T15:32:58.000+0200}, title = {An empirical model to describe performance degradation for warranty abuse detection in portable electronics.}, url = {http://dblp.uni-trier.de/db/journals/ress/ress142.html#OhCKYP15}, volume = 142, year = 2015 }