%0 Conference Paper %1 conf/natw/LiA15 %A Li, Baohu %A Agrawal, Vishwani D. %B NATW %D 2015 %I IEEE %K dblp %P 49-54 %T Multivalued Logic for Reduced Pin Count and Multi-site SoC Testing. %U http://dblp.uni-trier.de/db/conf/natw/natw2015.html#LiA15 %@ 978-1-4673-7417-0

@inproceedings{conf/natw/LiA15, added-at = {2017-05-26T00:00:00.000+0200}, author = {Li, Baohu and Agrawal, Vishwani D.}, biburl = {https://www.bibsonomy.org/bibtex/2ddc6d6ef35fd9a7e7b9eccd24de1a253/dblp}, booktitle = {NATW}, crossref = {conf/natw/2015}, ee = {https://doi.org/10.1109/NATW.2015.15}, interhash = {670d5a8a52f7183cc494390af9151a17}, intrahash = {ddc6d6ef35fd9a7e7b9eccd24de1a253}, isbn = {978-1-4673-7417-0}, keywords = {dblp}, pages = {49-54}, publisher = {IEEE}, timestamp = {2019-10-17T18:37:00.000+0200}, title = {Multivalued Logic for Reduced Pin Count and Multi-site SoC Testing.}, url = {http://dblp.uni-trier.de/db/conf/natw/natw2015.html#LiA15}, year = 2015 }