%0 Journal Article %1 journals/et/YuWX20 %A Yu, Dongzhe %A Wang, Han %A Xu, Jiangtao %D 2020 %J J. Electron. Test. %K dblp %N 3 %P 365-374 %T Impact of Worst-Case Excitation for DDR interface Signal and Power Integrity Co-Simulation. %U http://dblp.uni-trier.de/db/journals/et/et36.html#YuWX20 %V 36

@article{journals/et/YuWX20, added-at = {2020-09-11T00:00:00.000+0200}, author = {Yu, Dongzhe and Wang, Han and Xu, Jiangtao}, biburl = {https://www.bibsonomy.org/bibtex/25a023a87832ed2f354a18dba7a053b34/dblp}, ee = {https://doi.org/10.1007/s10836-020-05875-4}, interhash = {67e5e84a987cee049e36986048807628}, intrahash = {5a023a87832ed2f354a18dba7a053b34}, journal = {J. Electron. Test.}, keywords = {dblp}, number = 3, pages = {365-374}, timestamp = {2020-09-12T11:40:38.000+0200}, title = {Impact of Worst-Case Excitation for DDR interface Signal and Power Integrity Co-Simulation.}, url = {http://dblp.uni-trier.de/db/journals/et/et36.html#YuWX20}, volume = 36, year = 2020 }