%0 Conference Paper %1 conf/iscas/NaseerBDDW07 %A Naseer, Riaz %A Boulghassoul, Younes %A Draper, Jeff %A DasGupta, Sandeepan %A Witulski, Art %B ISCAS %D 2007 %I IEEE %K dblp %P 1879-1882 %T Critical Charge Characterization for Soft Error Rate Modeling in 90nm SRAM. %U http://dblp.uni-trier.de/db/conf/iscas/iscas2007.html#NaseerBDDW07 %@ 1-4244-0921-7

@inproceedings{conf/iscas/NaseerBDDW07, added-at = {2016-05-20T00:00:00.000+0200}, author = {Naseer, Riaz and Boulghassoul, Younes and Draper, Jeff and DasGupta, Sandeepan and Witulski, Art}, biburl = {https://www.bibsonomy.org/bibtex/28e3f48dd192f00e9e06ad026ba9ed9c3/dblp}, booktitle = {ISCAS}, crossref = {conf/iscas/2007}, ee = {http://dx.doi.org/10.1109/ISCAS.2007.378282}, interhash = {68107689dc65800b6ed4c2199661794d}, intrahash = {8e3f48dd192f00e9e06ad026ba9ed9c3}, isbn = {1-4244-0921-7}, keywords = {dblp}, pages = {1879-1882}, publisher = {IEEE}, timestamp = {2016-05-21T12:14:31.000+0200}, title = {Critical Charge Characterization for Soft Error Rate Modeling in 90nm SRAM.}, url = {http://dblp.uni-trier.de/db/conf/iscas/iscas2007.html#NaseerBDDW07}, year = 2007 }