%0 Conference Paper %1 conf/essderc/SchmidtDVP15 %A Schmidt, Andrei %A Dreiner, Stefan %A Vogt, Holger %A Paschen, Uwe %B ESSDERC %D 2015 %I IEEE %K %P 290-293 %T Thin-film SOI PIN-diode leakage current dependence on back-gate-potential and HCI traps. %U http://dblp.uni-trier.de/db/conf/essderc/essderc2015.html#SchmidtDVP15 %@ 978-1-4673-7135-3

@inproceedings{conf/essderc/SchmidtDVP15, added-at = {2023-12-13T00:51:51.000+0100}, author = {Schmidt, Andrei and Dreiner, Stefan and Vogt, Holger and Paschen, Uwe}, biburl = {https://www.bibsonomy.org/bibtex/25016ef1f4985f18f7a6aa3c188f12c8b/admin}, booktitle = {ESSDERC}, crossref = {conf/essderc/2015}, ee = {https://doi.org/10.1109/ESSDERC.2015.7324771}, interhash = {6980a16feee79edcfc3a664cadd4fa6f}, intrahash = {5016ef1f4985f18f7a6aa3c188f12c8b}, isbn = {978-1-4673-7135-3}, keywords = {}, pages = {290-293}, publisher = {IEEE}, timestamp = {2023-12-13T00:51:51.000+0100}, title = {Thin-film SOI PIN-diode leakage current dependence on back-gate-potential and HCI traps.}, url = {http://dblp.uni-trier.de/db/conf/essderc/essderc2015.html#SchmidtDVP15}, year = 2015 }