%0 Conference Paper %1 conf/cicc/TanabeHH06 %A Tanabe, Akira %A Hijioka, Ken'ichiro %A Hayashi, Yoshihiro %B CICC %D 2006 %I IEEE %K dblp %P 725-728 %T A Novel Monitoring Method of RF Characteristics Variations for Sub-0.1μm MOSFETs with Precise Gate-resistance Model. %U http://dblp.uni-trier.de/db/conf/cicc/cicc2006.html#TanabeHH06 %@ 1-4244-0075-9

@inproceedings{conf/cicc/TanabeHH06, added-at = {2017-05-17T00:00:00.000+0200}, author = {Tanabe, Akira and Hijioka, Ken'ichiro and Hayashi, Yoshihiro}, biburl = {https://www.bibsonomy.org/bibtex/28c4a7e25d0b791f19cd62565699dae36/dblp}, booktitle = {CICC}, crossref = {conf/cicc/2006}, ee = {https://doi.org/10.1109/CICC.2006.320925}, interhash = {6aa3c9432f0e60efb15387abdeaceb1d}, intrahash = {8c4a7e25d0b791f19cd62565699dae36}, isbn = {1-4244-0075-9}, keywords = {dblp}, pages = {725-728}, publisher = {IEEE}, timestamp = {2019-10-17T23:09:18.000+0200}, title = {A Novel Monitoring Method of RF Characteristics Variations for Sub-0.1μm MOSFETs with Precise Gate-resistance Model.}, url = {http://dblp.uni-trier.de/db/conf/cicc/cicc2006.html#TanabeHH06}, year = 2006 }