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- BibTeX key
- conf/irps/BaePYKKP15
- entry type
- inproceedings
- booktitle
- IRPS
- year
- 2015
- pages
- 13
- publisher
- IEEE
- crossref
- conf/irps/2015
- ee
- https://doi.org/10.1109/IRPS.2015.7112815
- isbn
- 978-1-4673-7362-3
- url
- http://dblp.uni-trier.de/db/conf/irps/irps2015.html#BaePYKKP15
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- please select -%0 Conference Paper
%1 conf/irps/BaePYKKP15
%A Bae, Choelhwyi
%A Pae, Sangwoo
%A sik Yu, Cheong
%A Kim, Kangjung
%A Kim, Yongshik
%A Park, Jongwoo
%B IRPS
%D 2015
%I IEEE
%K dblp
%P 13
%T SRAM stability design comprehending 14nm FinFET reliability.
%U http://dblp.uni-trier.de/db/conf/irps/irps2015.html#BaePYKKP15
%@ 978-1-4673-7362-3
@inproceedings{conf/irps/BaePYKKP15,
added-at = {2024-03-04T00:00:00.000+0100},
author = {Bae, Choelhwyi and Pae, Sangwoo and sik Yu, Cheong and Kim, Kangjung and Kim, Yongshik and Park, Jongwoo},
biburl = {https://www.bibsonomy.org/bibtex/2b9e38077e4ad89cfda1f309c387bcd97/dblp},
booktitle = {IRPS},
crossref = {conf/irps/2015},
ee = {https://doi.org/10.1109/IRPS.2015.7112815},
interhash = {6afea48a1446cff0c50ce2c4edb678ab},
intrahash = {b9e38077e4ad89cfda1f309c387bcd97},
isbn = {978-1-4673-7362-3},
keywords = {dblp},
pages = 13,
publisher = {IEEE},
timestamp = {2024-04-10T16:54:51.000+0200},
title = {SRAM stability design comprehending 14nm FinFET reliability.},
url = {http://dblp.uni-trier.de/db/conf/irps/irps2015.html#BaePYKKP15},
year = 2015
}