%0 Conference Paper %1 conf/ewdts/MatrosovaMS15 %A Matrosova, Anzhela Yu. %A Mitrofanov, Eugeniy %A Shah, Toral %B EWDTS %D 2015 %I IEEE Computer Society %K dblp %P 1-4 %T Multiple stuck-at fault testability of a combinational circuit derived by covering ROBDD nodes by Invert-And-Or sub-circuits. %U http://dblp.uni-trier.de/db/conf/ewdts/ewdts2015.html#MatrosovaMS15 %@ 978-1-4673-7776-8

@inproceedings{conf/ewdts/MatrosovaMS15, added-at = {2023-03-23T00:00:00.000+0100}, author = {Matrosova, Anzhela Yu. and Mitrofanov, Eugeniy and Shah, Toral}, biburl = {https://www.bibsonomy.org/bibtex/257d7a74d3552c2d444a23eb6a66efe3f/dblp}, booktitle = {EWDTS}, crossref = {conf/ewdts/2015}, ee = {https://doi.ieeecomputersociety.org/10.1109/EWDTS.2015.7493099}, interhash = {6c30f503f3fcecea773acfcf5e98b91c}, intrahash = {57d7a74d3552c2d444a23eb6a66efe3f}, isbn = {978-1-4673-7776-8}, keywords = {dblp}, pages = {1-4}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T08:21:59.000+0200}, title = {Multiple stuck-at fault testability of a combinational circuit derived by covering ROBDD nodes by Invert-And-Or sub-circuits.}, url = {http://dblp.uni-trier.de/db/conf/ewdts/ewdts2015.html#MatrosovaMS15}, year = 2015 }