%0 Conference Paper %1 conf/vlsid/GhoshRKCB08 %A Ghosh, Amlan %A Rao, Rahul M. %A Kim, Jae-Joon %A Chuang, Ching-Te %A Brown, Richard B. %B VLSI Design %D 2008 %I IEEE Computer Society %K dblp %P 143-149 %T On-Chip Process Variation Detection Using Slew-Rate Monitoring Circuit. %U http://dblp.uni-trier.de/db/conf/vlsid/vlsid2008.html#GhoshRKCB08 %@ 0-7695-3083-4

@inproceedings{conf/vlsid/GhoshRKCB08, added-at = {2023-03-24T00:00:00.000+0100}, author = {Ghosh, Amlan and Rao, Rahul M. and Kim, Jae-Joon and Chuang, Ching-Te and Brown, Richard B.}, biburl = {https://www.bibsonomy.org/bibtex/29cee3113f7e9702eeebc3e8cd50c4796/dblp}, booktitle = {VLSI Design}, crossref = {conf/vlsid/2008}, ee = {https://doi.ieeecomputersociety.org/10.1109/VLSI.2008.67}, interhash = {6c424c7d992c517615f15d8c03acc020}, intrahash = {9cee3113f7e9702eeebc3e8cd50c4796}, isbn = {0-7695-3083-4}, keywords = {dblp}, pages = {143-149}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T04:19:22.000+0200}, title = {On-Chip Process Variation Detection Using Slew-Rate Monitoring Circuit.}, url = {http://dblp.uni-trier.de/db/conf/vlsid/vlsid2008.html#GhoshRKCB08}, year = 2008 }