%0 Journal Article %1 journals/mr/ZhuLGW14 %A Zhu, Yongxin %A Li, Xiaoyan %A Gao, Ruiting %A Wang, Chao %D 2014 %J Microelectron. Reliab. %K %N 12 %P 2922-2928 %T Low-cycle fatigue failure behavior and life evaluation of lead-free solder joint under high temperature. %U http://dblp.uni-trier.de/db/journals/mr/mr54.html#ZhuLGW14 %V 54

@article{journals/mr/ZhuLGW14, added-at = {2023-12-13T01:04:02.000+0100}, author = {Zhu, Yongxin and Li, Xiaoyan and Gao, Ruiting and Wang, Chao}, biburl = {https://www.bibsonomy.org/bibtex/2c80429ec274aa3379c7c1c579fb992d4/admin}, ee = {https://doi.org/10.1016/j.microrel.2014.08.016}, interhash = {6c59047f917300a4ed37925aade7520c}, intrahash = {c80429ec274aa3379c7c1c579fb992d4}, journal = {Microelectron. Reliab.}, keywords = {}, number = 12, pages = {2922-2928}, timestamp = {2023-12-13T01:04:02.000+0100}, title = {Low-cycle fatigue failure behavior and life evaluation of lead-free solder joint under high temperature.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr54.html#ZhuLGW14}, volume = 54, year = 2014 }