%0 Journal Article %1 journals/et/PappuBAM98 %A Pappu, Lakshminarayana %A Bushnell, Michael L. %A Agrawal, Vishwani D. %A Srinivas, Mandyam-Komar %D 1998 %J J. Electron. Test. %K dblp %N 3 %P 239-254 %T Statistical Delay Fault Coverage Estimation for Synchronous Sequential Circuits. %U http://dblp.uni-trier.de/db/journals/et/et12.html#PappuBAM98 %V 12

@article{journals/et/PappuBAM98, added-at = {2020-09-11T00:00:00.000+0200}, author = {Pappu, Lakshminarayana and Bushnell, Michael L. and Agrawal, Vishwani D. and Srinivas, Mandyam-Komar}, biburl = {https://www.bibsonomy.org/bibtex/299b912cf6917e3044d891f78e2716faf/dblp}, ee = {https://doi.org/10.1023/A:1008228817698}, interhash = {6cada63b8dfa396dcf177c60c1ebaab7}, intrahash = {99b912cf6917e3044d891f78e2716faf}, journal = {J. Electron. Test.}, keywords = {dblp}, number = 3, pages = {239-254}, timestamp = {2020-09-12T11:40:28.000+0200}, title = {Statistical Delay Fault Coverage Estimation for Synchronous Sequential Circuits.}, url = {http://dblp.uni-trier.de/db/journals/et/et12.html#PappuBAM98}, volume = 12, year = 1998 }