%0 Journal Article %1 journals/integration/BerrimaBS18 %A Berrima, Safa %A Blaquière, Yves %A Savaria, Yvon %D 2018 %J Integr. %K dblp %P 159-169 %T Diagnosis algorithms for a reconfigurable and defect tolerant JTAG scan chain in large area integrated circuits. %U http://dblp.uni-trier.de/db/journals/integration/integration62.html#BerrimaBS18 %V 62

@article{journals/integration/BerrimaBS18, added-at = {2020-02-20T00:00:00.000+0100}, author = {Berrima, Safa and Blaquière, Yves and Savaria, Yvon}, biburl = {https://www.bibsonomy.org/bibtex/2ced915359098b1984dc2584e1b9d8b2d/dblp}, ee = {https://doi.org/10.1016/j.vlsi.2018.02.010}, interhash = {71502980c65b783e437fdcd42d52087e}, intrahash = {ced915359098b1984dc2584e1b9d8b2d}, journal = {Integr.}, keywords = {dblp}, pages = {159-169}, timestamp = {2020-02-21T11:53:15.000+0100}, title = {Diagnosis algorithms for a reconfigurable and defect tolerant JTAG scan chain in large area integrated circuits.}, url = {http://dblp.uni-trier.de/db/journals/integration/integration62.html#BerrimaBS18}, volume = 62, year = 2018 }