%0 Conference Paper %1 conf/itc/LinRPR01 %A Lin, Xijiang %A Rajski, Janusz %A Pomeranz, Irith %A Reddy, Sudhakar M. %B ITC %D 2001 %I IEEE Computer Society %K dblp %P 1088-1097 %T On static test compaction and test pattern ordering for scan designs. %U http://dblp.uni-trier.de/db/conf/itc/itc2001.html#LinRPR01 %@ 0-7803-7169-0

@inproceedings{conf/itc/LinRPR01, added-at = {2023-03-23T00:00:00.000+0100}, author = {Lin, Xijiang and Rajski, Janusz and Pomeranz, Irith and Reddy, Sudhakar M.}, biburl = {https://www.bibsonomy.org/bibtex/21dea0191edd695c47d50b95e54b1a479/dblp}, booktitle = {ITC}, crossref = {conf/itc/2001}, ee = {https://doi.ieeecomputersociety.org/10.1109/TEST.2001.966735}, interhash = {7673c1ffb08ad955224a04ae590d87e7}, intrahash = {1dea0191edd695c47d50b95e54b1a479}, isbn = {0-7803-7169-0}, keywords = {dblp}, pages = {1088-1097}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T04:28:56.000+0200}, title = {On static test compaction and test pattern ordering for scan designs.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc2001.html#LinRPR01}, year = 2001 }