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%0 Conference Paper
%1 conf/date/ZordanBDGTVB13
%A Zordan, Leonardo Bonet
%A Bosio, Alberto
%A Dilillo, Luigi
%A Girard, Patrick
%A Todri, Aida
%A Virazel, Arnaud
%A Badereddine, Nabil
%B DATE
%D 2013
%E Macii, Enrico
%I EDA Consortium San Jose, CA, USA / ACM DL
%K dblp
%P 442-447
%T Test solution for data retention faults in low-power SRAMs.
%U http://dblp.uni-trier.de/db/conf/date/date2013.html#ZordanBDGTVB13
%@ 978-1-4503-2153-2
@inproceedings{conf/date/ZordanBDGTVB13,
added-at = {2023-03-21T00:00:00.000+0100},
author = {Zordan, Leonardo Bonet and Bosio, Alberto and Dilillo, Luigi and Girard, Patrick and Todri, Aida and Virazel, Arnaud and Badereddine, Nabil},
biburl = {https://www.bibsonomy.org/bibtex/2344ba2ea76542ec9be45c44810275dd0/dblp},
booktitle = {DATE},
crossref = {conf/date/2013},
editor = {Macii, Enrico},
ee = {http://dl.acm.org/citation.cfm?id=2485394},
interhash = {77c48f2faeebb3f56a20378d3324d4bf},
intrahash = {344ba2ea76542ec9be45c44810275dd0},
isbn = {978-1-4503-2153-2},
keywords = {dblp},
pages = {442-447},
publisher = {EDA Consortium San Jose, CA, USA / ACM DL},
timestamp = {2024-04-10T06:49:49.000+0200},
title = {Test solution for data retention faults in low-power SRAMs.},
url = {http://dblp.uni-trier.de/db/conf/date/date2013.html#ZordanBDGTVB13},
year = 2013
}