%0 Journal Article %1 journals/mr/KimKCPJSSC13 %A Kim, K. S. %A Kim, H. J. %A Choi, P. H. %A Park, H. S. %A Joo, I. H. %A Song, J. E. %A Song, D. H. %A Choi, Byoung Deog %D 2013 %J Microelectron. Reliab. %K dblp %N 7 %P 947-951 %T Hot hole-induced device degradation by drain junction reverse current. %U http://dblp.uni-trier.de/db/journals/mr/mr53.html#KimKCPJSSC13 %V 53

@article{journals/mr/KimKCPJSSC13, added-at = {2020-04-08T00:00:00.000+0200}, author = {Kim, K. S. and Kim, H. J. and Choi, P. H. and Park, H. S. and Joo, I. H. and Song, J. E. and Song, D. H. and Choi, Byoung Deog}, biburl = {https://www.bibsonomy.org/bibtex/223c60a3bbd49c68c731ba16b0c27cabc/dblp}, ee = {https://doi.org/10.1016/j.microrel.2013.04.006}, interhash = {788e223abdcefb7eddd216711e36a864}, intrahash = {23c60a3bbd49c68c731ba16b0c27cabc}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = 7, pages = {947-951}, timestamp = {2020-04-09T11:41:13.000+0200}, title = {Hot hole-induced device degradation by drain junction reverse current.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr53.html#KimKCPJSSC13}, volume = 53, year = 2013 }