%0 Journal Article %1 journals/access/AkbarLT22 %A Akbar, Chandni %A Li, Yiming %A Thoti, Narasimhulu %D 2022 %J IEEE Access %K dblp %P 53098-53107 %T Device-Simulation-Based Machine Learning Technique for the Characteristic of Line Tunnel Field-Effect Transistors. %U http://dblp.uni-trier.de/db/journals/access/access10.html#AkbarLT22 %V 10

@article{journals/access/AkbarLT22, added-at = {2023-03-19T00:00:00.000+0100}, author = {Akbar, Chandni and Li, Yiming and Thoti, Narasimhulu}, biburl = {https://www.bibsonomy.org/bibtex/282997566b3cb1f1f36abf7f8b834fd27/dblp}, ee = {https://doi.org/10.1109/ACCESS.2022.3174685}, interhash = {793308c0caa9e0f049617115765b4b97}, intrahash = {82997566b3cb1f1f36abf7f8b834fd27}, journal = {IEEE Access}, keywords = {dblp}, pages = {53098-53107}, timestamp = {2024-04-08T13:59:17.000+0200}, title = {Device-Simulation-Based Machine Learning Technique for the Characteristic of Line Tunnel Field-Effect Transistors.}, url = {http://dblp.uni-trier.de/db/journals/access/access10.html#AkbarLT22}, volume = 10, year = 2022 }