%0 Journal Article %1 journals/computer/Aitken99 %A Aitken, Robert C. %D 1999 %J Computer %K dblp %N 11 %P 46-51 %T Nanometer Technology Effects on Fault Models for IC Testing. %U http://dblp.uni-trier.de/db/journals/computer/computer32.html#Aitken99 %V 32

@article{journals/computer/Aitken99, added-at = {2020-08-12T00:00:00.000+0200}, author = {Aitken, Robert C.}, biburl = {https://www.bibsonomy.org/bibtex/2d9d6c078b05ce94f22950ba35a39a530/dblp}, ee = {http://doi.ieeecomputersociety.org/10.1109/2.803640}, interhash = {7b0f8875090a23627beeb3d433e73f74}, intrahash = {d9d6c078b05ce94f22950ba35a39a530}, journal = {Computer}, keywords = {dblp}, number = 11, pages = {46-51}, timestamp = {2020-08-13T11:46:48.000+0200}, title = {Nanometer Technology Effects on Fault Models for IC Testing.}, url = {http://dblp.uni-trier.de/db/journals/computer/computer32.html#Aitken99}, volume = 32, year = 1999 }