%0 Journal Article %1 journals/mr/Le12 %A Le, Jia-Liang %D 2012 %J Microelectron. Reliab. %K dblp %N 1 %P 100-106 %T A finite weakest-link model of lifetime distribution of high-k gate dielectrics under unipolar AC voltage stress. %U http://dblp.uni-trier.de/db/journals/mr/mr52.html#Le12 %V 52

@article{journals/mr/Le12, added-at = {2020-02-22T00:00:00.000+0100}, author = {Le, Jia-Liang}, biburl = {https://www.bibsonomy.org/bibtex/2b5f41a805f59536737ab00f57d52e927/dblp}, ee = {https://doi.org/10.1016/j.microrel.2011.09.010}, interhash = {7b3ed5240ad150a43155ee1af52779f9}, intrahash = {b5f41a805f59536737ab00f57d52e927}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = 1, pages = {100-106}, timestamp = {2020-02-25T13:26:32.000+0100}, title = {A finite weakest-link model of lifetime distribution of high-k gate dielectrics under unipolar AC voltage stress.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr52.html#Le12}, volume = 52, year = 2012 }