Article,
A physical approach on SCOBIC investigation in VLSI.
T. Beauchêne, D. Lewis, F. Beaudoin, V. Pouget, P. Perdu, P. Fouillat, and Y. Danto.Microelectron. Reliab., 43 (1): 173-177 (2003)
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- entry type
- article
- year
- 2003
- journal
- Microelectron. Reliab.
- number
- 1
- pages
- 173-177
- volume
- 43
- ee
- https://doi.org/10.1016/S0026-2714(02)00282-2
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- http://dblp.uni-trier.de/db/journals/mr/mr43.html#BeaucheneLBPPFD03
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- please select -%0 Journal Article
%1 journals/mr/BeaucheneLBPPFD03
%A Beauchêne, Thomas
%A Lewis, Dean
%A Beaudoin, Felix
%A Pouget, Vincent
%A Perdu, Philippe
%A Fouillat, Pascal
%A Danto, Yves
%D 2003
%J Microelectron. Reliab.
%K dblp
%N 1
%P 173-177
%T A physical approach on SCOBIC investigation in VLSI.
%U http://dblp.uni-trier.de/db/journals/mr/mr43.html#BeaucheneLBPPFD03
%V 43
@article{journals/mr/BeaucheneLBPPFD03,
added-at = {2021-01-20T00:00:00.000+0100},
author = {Beauchêne, Thomas and Lewis, Dean and Beaudoin, Felix and Pouget, Vincent and Perdu, Philippe and Fouillat, Pascal and Danto, Yves},
biburl = {https://www.bibsonomy.org/bibtex/206e05f2b06b1e353dcdbf58ffa7e0df3/dblp},
ee = {https://doi.org/10.1016/S0026-2714(02)00282-2},
interhash = {7b763cabede383a45c2fb85de18e19a6},
intrahash = {06e05f2b06b1e353dcdbf58ffa7e0df3},
journal = {Microelectron. Reliab.},
keywords = {dblp},
number = 1,
pages = {173-177},
timestamp = {2024-04-09T02:50:44.000+0200},
title = {A physical approach on SCOBIC investigation in VLSI.},
url = {http://dblp.uni-trier.de/db/journals/mr/mr43.html#BeaucheneLBPPFD03},
volume = 43,
year = 2003
}