%0 Conference Paper %1 conf/ats/RiahiNL03 %A Riahi, Pedram A. %A Navabi, Zainalabedin %A Lombardi, Fabrizio %B Asian Test Symposium %D 2003 %I IEEE Computer Society %K dblp %P 274-277 %T The VPI-Based Combinational IP Core Module-Based Mixed Level Serial Fault Simulation and Test Generation Methodology. %U http://dblp.uni-trier.de/db/conf/ats/ats2003.html#RiahiNL03 %@ 0-7695-1951-2

@inproceedings{conf/ats/RiahiNL03, added-at = {2023-03-24T00:00:00.000+0100}, author = {Riahi, Pedram A. and Navabi, Zainalabedin and Lombardi, Fabrizio}, biburl = {https://www.bibsonomy.org/bibtex/2ded78e4d2b87f24f4a1e191624a0b231/dblp}, booktitle = {Asian Test Symposium}, crossref = {conf/ats/2003}, ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.2003.1250822}, interhash = {7c7a8d7399f489356b9f22428905a7c4}, intrahash = {ded78e4d2b87f24f4a1e191624a0b231}, isbn = {0-7695-1951-2}, keywords = {dblp}, pages = {274-277}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T06:35:36.000+0200}, title = {The VPI-Based Combinational IP Core Module-Based Mixed Level Serial Fault Simulation and Test Generation Methodology.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats2003.html#RiahiNL03}, year = 2003 }