%0 Conference Paper %1 conf/vlsid/JacobA92 %A Jacob, James %A Agrawal, Vishwani D. %B VLSI Design %D 1992 %I IEEE Computer Society %K dblp %P 17-24 %T Functional Test Generation for Sequential Circuits. %U http://dblp.uni-trier.de/db/conf/vlsid/vlsid1992.html#JacobA92 %@ 0-8186-2465-5

@inproceedings{conf/vlsid/JacobA92, added-at = {2023-03-24T00:00:00.000+0100}, author = {Jacob, James and Agrawal, Vishwani D.}, biburl = {https://www.bibsonomy.org/bibtex/2ead85499b6b1e7d0d030705ec13b60d2/dblp}, booktitle = {VLSI Design}, crossref = {conf/vlsid/1992}, ee = {https://doi.ieeecomputersociety.org/10.1109/ICVD.1992.658015}, interhash = {7cbd0b7503e62d9e7421df130a2e0801}, intrahash = {ead85499b6b1e7d0d030705ec13b60d2}, isbn = {0-8186-2465-5}, keywords = {dblp}, pages = {17-24}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T05:47:09.000+0200}, title = {Functional Test Generation for Sequential Circuits.}, url = {http://dblp.uni-trier.de/db/conf/vlsid/vlsid1992.html#JacobA92}, year = 1992 }