%0 Conference Paper %1 conf/vts/RajanLA96 %A Rajan, Krishna B. %A Long, David E. %A Abramovici, Miron %B VTS %D 1996 %I IEEE Computer Society %K dblp %P 224-230 %T Increasing testability by clock transformation (getting rid of those darn states). %U http://dblp.uni-trier.de/db/conf/vts/vts1996.html#RajanLA96 %@ 0-8186-7304-4

@inproceedings{conf/vts/RajanLA96, added-at = {2023-03-24T00:00:00.000+0100}, author = {Rajan, Krishna B. and Long, David E. and Abramovici, Miron}, biburl = {https://www.bibsonomy.org/bibtex/23ecf1748031248b1cb0c987ff0ed8e91/dblp}, booktitle = {VTS}, crossref = {conf/vts/1996}, ee = {https://doi.ieeecomputersociety.org/10.1109/VTEST.1996.510861}, interhash = {7d9c2d7e2cd83b8fb8bd92b20aa2d0d9}, intrahash = {3ecf1748031248b1cb0c987ff0ed8e91}, isbn = {0-8186-7304-4}, keywords = {dblp}, pages = {224-230}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T07:35:16.000+0200}, title = {Increasing testability by clock transformation (getting rid of those darn states).}, url = {http://dblp.uni-trier.de/db/conf/vts/vts1996.html#RajanLA96}, year = 1996 }