%0 Journal Article %1 journals/et/ShiCLCSLTC21 %A Shi, Shuting %A Chen, Rui %A Liu, Rui %A Chen, Mo %A Shen, Chen %A Li, Xuantian %A Tian, Haonan %A Chen, Li %D 2021 %J J. Electron. Test. %K dblp %N 2 %P 271-278 %T Single Event Upset Evaluation for a 28-nm FDSOI SRAM Type Buffer in an ARM Processor. %U http://dblp.uni-trier.de/db/journals/et/et37.html#ShiCLCSLTC21 %V 37

@article{journals/et/ShiCLCSLTC21, added-at = {2023-09-30T00:00:00.000+0200}, author = {Shi, Shuting and Chen, Rui and Liu, Rui and Chen, Mo and Shen, Chen and Li, Xuantian and Tian, Haonan and Chen, Li}, biburl = {https://www.bibsonomy.org/bibtex/2cb5e58edbd26384fb5997c3629420248/dblp}, ee = {https://doi.org/10.1007/s10836-021-05940-6}, interhash = {7ee00ff82fdd0420a6ffc26fe7e54ca7}, intrahash = {cb5e58edbd26384fb5997c3629420248}, journal = {J. Electron. Test.}, keywords = {dblp}, number = 2, pages = {271-278}, timestamp = {2024-04-08T20:52:46.000+0200}, title = {Single Event Upset Evaluation for a 28-nm FDSOI SRAM Type Buffer in an ARM Processor.}, url = {http://dblp.uni-trier.de/db/journals/et/et37.html#ShiCLCSLTC21}, volume = 37, year = 2021 }