%0 Journal Article %1 journals/mr/YuanSDZ08 %A Yuan, Cadmus A. %A van der Sluis, Olaf %A van Driel, Willem D. %A Zhang, G. Q. (Kouchi) %D 2008 %J Microelectron. Reliab. %K dblp %N 6 %P 833-842 %T The need for multi-scale approaches in Cu/low-k reliability issues. %U http://dblp.uni-trier.de/db/journals/mr/mr48.html#YuanSDZ08 %V 48

@article{journals/mr/YuanSDZ08, added-at = {2023-09-30T00:00:00.000+0200}, author = {Yuan, Cadmus A. and van der Sluis, Olaf and van Driel, Willem D. and Zhang, G. Q. (Kouchi)}, biburl = {https://www.bibsonomy.org/bibtex/265a9a128122ebbe9b19876218c965404/dblp}, ee = {https://doi.org/10.1016/j.microrel.2008.03.024}, interhash = {7eedf5689d32344a9ee421ccc8367869}, intrahash = {65a9a128122ebbe9b19876218c965404}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = 6, pages = {833-842}, timestamp = {2024-04-09T02:48:37.000+0200}, title = {The need for multi-scale approaches in Cu/low-k reliability issues.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr48.html#YuanSDZ08}, volume = 48, year = 2008 }