%0 Journal Article %1 journals/tcad/JallepalliMPHM16a %A Jallepalli, Srinivas %A Mooraka, Ram %A Parihar, Sanjay %A Hunter, Earl %A Maalouf, Elie %D 2016 %J IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. %K dblp %N 6 %P 957-970 %T Rapid Assessment of Design Sensitivity to Process Excursions via Scaled Sigma Sampling. %U http://dblp.uni-trier.de/db/journals/tcad/tcad35.html#JallepalliMPHM16a %V 35

@article{journals/tcad/JallepalliMPHM16a, added-at = {2020-09-24T00:00:00.000+0200}, author = {Jallepalli, Srinivas and Mooraka, Ram and Parihar, Sanjay and Hunter, Earl and Maalouf, Elie}, biburl = {https://www.bibsonomy.org/bibtex/208be77c62c16a952aa59ad2c2715af64/dblp}, ee = {https://doi.org/10.1109/TCAD.2016.2523445}, interhash = {844efdf89ebbf5175549dbd17fcc8212}, intrahash = {08be77c62c16a952aa59ad2c2715af64}, journal = {IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.}, keywords = {dblp}, number = 6, pages = {957-970}, timestamp = {2020-09-25T11:47:21.000+0200}, title = {Rapid Assessment of Design Sensitivity to Process Excursions via Scaled Sigma Sampling.}, url = {http://dblp.uni-trier.de/db/journals/tcad/tcad35.html#JallepalliMPHM16a}, volume = 35, year = 2016 }