%0 Journal Article %1 journals/infsof/GuoHHD06 %A Guo, Qiang %A Hierons, Robert M. %A Harman, Mark %A Derderian, Karnig %D 2006 %J Inf. Softw. Technol. %K dblp %N 8 %P 696-707 %T Improving test quality using robust unique input/output circuit sequences (UIOCs). %U http://dblp.uni-trier.de/db/journals/infsof/infsof48.html#GuoHHD06 %V 48

@article{journals/infsof/GuoHHD06, added-at = {2020-09-05T00:00:00.000+0200}, author = {Guo, Qiang and Hierons, Robert M. and Harman, Mark and Derderian, Karnig}, biburl = {https://www.bibsonomy.org/bibtex/25f92c7cc31730e146fd12d5d193bf041/dblp}, ee = {https://www.wikidata.org/entity/Q59610313}, interhash = {85ab008fef1dcc40dda5240bc3edd849}, intrahash = {5f92c7cc31730e146fd12d5d193bf041}, journal = {Inf. Softw. Technol.}, keywords = {dblp}, number = 8, pages = {696-707}, timestamp = {2020-09-09T13:32:27.000+0200}, title = {Improving test quality using robust unique input/output circuit sequences (UIOCs).}, url = {http://dblp.uni-trier.de/db/journals/infsof/infsof48.html#GuoHHD06}, volume = 48, year = 2006 }