%0 Conference Paper %1 conf/itc/MenozziLSR90 %A Menozzi, Roberto %A Lanzoni, Massimo %A Selmi, Luca %A Riccò, Bruno %B ITC %D 1990 %I IEEE Computer Society %K dblp %P 1028-1034 %T An improved procedure to test CMOS ICs for latch-up. %U http://dblp.uni-trier.de/db/conf/itc/itc1990.html#MenozziLSR90 %@ 0-8186-9064-X

@inproceedings{conf/itc/MenozziLSR90, added-at = {2023-05-03T00:00:00.000+0200}, author = {Menozzi, Roberto and Lanzoni, Massimo and Selmi, Luca and Riccò, Bruno}, biburl = {https://www.bibsonomy.org/bibtex/20fa35f75b0ee0c7482d6cacc082c0845/dblp}, booktitle = {ITC}, crossref = {conf/itc/1990}, ee = {https://doi.ieeecomputersociety.org/10.1109/TEST.1990.114126}, interhash = {86d1adbaf00f77d813d2a0069a00bf0c}, intrahash = {0fa35f75b0ee0c7482d6cacc082c0845}, isbn = {0-8186-9064-X}, keywords = {dblp}, pages = {1028-1034}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T19:52:40.000+0200}, title = {An improved procedure to test CMOS ICs for latch-up.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc1990.html#MenozziLSR90}, year = 1990 }