%0 Conference Paper %1 conf/dft/GhavamiRPA11 %A Ghavami, Behnam %A Raji, Mohsen %A Pedram, Hossein %A Arjmand, Omid Naghshineh %B DFT %D 2011 %I IEEE Computer Society %K dblp %P 86-92 %T CNT-count Failure Characteristics of Carbon Nanotube FETs under Process Variations. %U http://dblp.uni-trier.de/db/conf/dft/dft2011.html#GhavamiRPA11 %@ 978-1-4577-1713-0

@inproceedings{conf/dft/GhavamiRPA11, added-at = {2023-03-24T00:00:00.000+0100}, author = {Ghavami, Behnam and Raji, Mohsen and Pedram, Hossein and Arjmand, Omid Naghshineh}, biburl = {https://www.bibsonomy.org/bibtex/28463a21e2824da0ca1c90fd3be84da2a/dblp}, booktitle = {DFT}, crossref = {conf/dft/2011}, ee = {https://doi.ieeecomputersociety.org/10.1109/DFT.2011.31}, interhash = {87f2041db0d8343c99cb2e2e0ec0b5f6}, intrahash = {8463a21e2824da0ca1c90fd3be84da2a}, isbn = {978-1-4577-1713-0}, keywords = {dblp}, pages = {86-92}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T12:57:33.000+0200}, title = {CNT-count Failure Characteristics of Carbon Nanotube FETs under Process Variations.}, url = {http://dblp.uni-trier.de/db/conf/dft/dft2011.html#GhavamiRPA11}, year = 2011 }