%0 Conference Paper %1 conf/itc/CrouchMMPT99 %A Crouch, Alfred L. %A Mateja, Michael %A McLaurin, Teresa L. %A Potter, John C. %A Tran, Dat %B ITC %D 1999 %I IEEE Computer Society %K dblp %P 913-922 %T The testability features of the 3rd generation ColdFire family of microprocessors. %U http://dblp.uni-trier.de/db/conf/itc/itc1999.html#CrouchMMPT99 %@ 0-7803-5753-1

@inproceedings{conf/itc/CrouchMMPT99, added-at = {2023-03-23T00:00:00.000+0100}, author = {Crouch, Alfred L. and Mateja, Michael and McLaurin, Teresa L. and Potter, John C. and Tran, Dat}, biburl = {https://www.bibsonomy.org/bibtex/2fa6413ddb123075f695cf6aff93344df/dblp}, booktitle = {ITC}, crossref = {conf/itc/1999}, ee = {https://doi.ieeecomputersociety.org/10.1109/TEST.1999.805823}, interhash = {881b54826960d6c245eeb1157f1de96f}, intrahash = {fa6413ddb123075f695cf6aff93344df}, isbn = {0-7803-5753-1}, keywords = {dblp}, pages = {913-922}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T19:53:23.000+0200}, title = {The testability features of the 3rd generation ColdFire family of microprocessors.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc1999.html#CrouchMMPT99}, year = 1999 }