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%0 Conference Paper
%1 conf/itc/LinTCCSHHB03
%A Lin, Henry C.
%A Taylor, Karen
%A Chong, Alan
%A Chan, Eddie
%A Soma, Mani
%A Haggag, Hosam
%A Huard, Jeff
%A Braatz, Jim
%B ITC
%D 2003
%I IEEE Computer Society
%K dblp
%P 67-76
%T CMOS Built-In Test Architecture for High-Speed Jitter Measurement.
%U http://dblp.uni-trier.de/db/conf/itc/itc2003.html#LinTCCSHHB03
%@ 0-7803-8106-8
@inproceedings{conf/itc/LinTCCSHHB03,
added-at = {2023-03-23T00:00:00.000+0100},
author = {Lin, Henry C. and Taylor, Karen and Chong, Alan and Chan, Eddie and Soma, Mani and Haggag, Hosam and Huard, Jeff and Braatz, Jim},
biburl = {https://www.bibsonomy.org/bibtex/253da38203600b0b584ca220e6b0e8b07/dblp},
booktitle = {ITC},
crossref = {conf/itc/2003},
ee = {https://doi.ieeecomputersociety.org/10.1109/TEST.2003.1270826},
interhash = {88d6fe7a53a0c9542f18c9025cee7108},
intrahash = {53da38203600b0b584ca220e6b0e8b07},
isbn = {0-7803-8106-8},
keywords = {dblp},
pages = {67-76},
publisher = {IEEE Computer Society},
timestamp = {2024-04-10T04:28:31.000+0200},
title = {CMOS Built-In Test Architecture for High-Speed Jitter Measurement.},
url = {http://dblp.uni-trier.de/db/conf/itc/itc2003.html#LinTCCSHHB03},
year = 2003
}