%0 Conference Paper %1 conf/ets/WeiLW16 %A Wei, Sin-Yu %A Lin, Bing-Yang %A Wu, Cheng-Wen %B ETS %D 2016 %I IEEE %K dblp %P 1-6 %T A fast sweep-line-based failure pattern extractor for memory diagnosis. %U http://dblp.uni-trier.de/db/conf/ets/ets2016.html#WeiLW16 %@ 978-1-4673-9659-2

@inproceedings{conf/ets/WeiLW16, added-at = {2023-09-30T00:00:00.000+0200}, author = {Wei, Sin-Yu and Lin, Bing-Yang and Wu, Cheng-Wen}, biburl = {https://www.bibsonomy.org/bibtex/253c5ac94b79fa3176d26e3d19ad6439f/dblp}, booktitle = {ETS}, crossref = {conf/ets/2016}, ee = {https://doi.org/10.1109/ETS.2016.7519314}, interhash = {8a9a37a98c8b0bc59cac3d42d8f8f0ae}, intrahash = {53c5ac94b79fa3176d26e3d19ad6439f}, isbn = {978-1-4673-9659-2}, keywords = {dblp}, pages = {1-6}, publisher = {IEEE}, timestamp = {2024-04-10T20:48:33.000+0200}, title = {A fast sweep-line-based failure pattern extractor for memory diagnosis.}, url = {http://dblp.uni-trier.de/db/conf/ets/ets2016.html#WeiLW16}, year = 2016 }