%0 Conference Paper %1 HOEF2002 %A Hoefler, A. %A Higman, J.M. %A Harp, T. %A Kuhn, P.J. %B 40th Annual International Reliability Physics Symposioum %C Dallas, TExas %D 2002 %K imported %P 21--25 %T Statistical Modeling of the Program/Erase Cycling Acceleration of Low Temperature Data Retention in Floating Gate Nonvolatile Memories

@inproceedings{HOEF2002, added-at = {2013-01-07T16:10:56.000+0100}, address = {Dallas, TExas}, author = {Hoefler, A. and Higman, J.M. and Harp, T. and Kuhn, P.J.}, biburl = {https://www.bibsonomy.org/bibtex/2831fdad1aa9d5fe54bfd777b0cf3e430/olivia.bluder}, booktitle = {40th Annual International Reliability Physics Symposioum}, file = {:P\:\\KAI_AP2\\People\\Bluder\\Literatur\\Smart_Power_Switches\\HOEFLER_Statistical_modeling_nonvolatile_memories.pdf:PDF}, interhash = {18bd9b249952276af61962fd9c63c31e}, intrahash = {831fdad1aa9d5fe54bfd777b0cf3e430}, keywords = {imported}, owner = {bluder}, pages = {21--25}, timestamp = {2013-01-07T16:11:03.000+0100}, title = {Statistical Modeling of the Program/Erase Cycling Acceleration of Low Temperature Data Retention in Floating Gate Nonvolatile Memories}, year = 2002 }