%0 Journal Article %1 journals/tc/AbadirB86 %A Abadir, Magdy S. %A Breuer, Melvin A. %D 1986 %J IEEE Trans. Computers %K dblp %N 4 %P 361-367 %T Test Schedules for VLSI Circuits Having Built-In Test Hardware. %U http://dblp.uni-trier.de/db/journals/tc/tc35.html#AbadirB86 %V 35

@article{journals/tc/AbadirB86, added-at = {2015-12-22T00:00:00.000+0100}, author = {Abadir, Magdy S. and Breuer, Melvin A.}, biburl = {https://www.bibsonomy.org/bibtex/2d650176888569c9ea93575e2383f0311/dblp}, ee = {http://doi.ieeecomputersociety.org/10.1109/TC.1986.1676771}, interhash = {8c4de057cea27f1d396aa12350ca4578}, intrahash = {d650176888569c9ea93575e2383f0311}, journal = {IEEE Trans. Computers}, keywords = {dblp}, number = 4, pages = {361-367}, timestamp = {2015-12-24T12:08:55.000+0100}, title = {Test Schedules for VLSI Circuits Having Built-In Test Hardware.}, url = {http://dblp.uni-trier.de/db/journals/tc/tc35.html#AbadirB86}, volume = 35, year = 1986 }