%0 Conference Paper %1 conf/ats/InoueHF08 %A Inoue, Ryoichi %A Hosokawa, Toshinori %A Fujiwara, Hideo %B ATS %D 2008 %I IEEE Computer Society %K dblp %P 27-34 %T A Test Generation Method for State-Observable FSMs to Increase Defect Coverage under the Test Length Constraint. %U http://dblp.uni-trier.de/db/conf/ats/ats2008.html#InoueHF08 %@ 978-0-7695-3396-4

@inproceedings{conf/ats/InoueHF08, added-at = {2023-03-24T00:00:00.000+0100}, author = {Inoue, Ryoichi and Hosokawa, Toshinori and Fujiwara, Hideo}, biburl = {https://www.bibsonomy.org/bibtex/2a26a8b82c42e2f19d51da3648a085bd3/dblp}, booktitle = {ATS}, crossref = {conf/ats/2008}, ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.2008.32}, interhash = {8cd200d5efd64e9801cb43c7320379b9}, intrahash = {a26a8b82c42e2f19d51da3648a085bd3}, isbn = {978-0-7695-3396-4}, keywords = {dblp}, pages = {27-34}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T06:37:03.000+0200}, title = {A Test Generation Method for State-Observable FSMs to Increase Defect Coverage under the Test Length Constraint.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats2008.html#InoueHF08}, year = 2008 }