%0 Journal Article %1 journals/jssc/YoshidaNNNMTMK10 %A Yoshida, Yoichi %A Nose, Koichi %A Nakagawa, Yoshihiro %A Noguchi, Koichiro %A Morita, Yasuhiro %A Tago, Masamoto %A Mizuno, Masayuki %A Kuroda, Tadahiro %D 2010 %J IEEE J. Solid State Circuits %K dblp %N 10 %P 2057-2065 %T An Inductive-Coupling DC Voltage Transceiver for Highly Parallel Wafer-Level Testing. %U http://dblp.uni-trier.de/db/journals/jssc/jssc45.html#YoshidaNNNMTMK10 %V 45

@article{journals/jssc/YoshidaNNNMTMK10, added-at = {2020-08-30T00:00:00.000+0200}, author = {Yoshida, Yoichi and Nose, Koichi and Nakagawa, Yoshihiro and Noguchi, Koichiro and Morita, Yasuhiro and Tago, Masamoto and Mizuno, Masayuki and Kuroda, Tadahiro}, biburl = {https://www.bibsonomy.org/bibtex/28223cacec0ea9ee8cab59d964391c9af/dblp}, ee = {https://doi.org/10.1109/JSSC.2010.2061653}, interhash = {903f82f75cef5d4f0b1abe3f123d49cc}, intrahash = {8223cacec0ea9ee8cab59d964391c9af}, journal = {IEEE J. Solid State Circuits}, keywords = {dblp}, number = 10, pages = {2057-2065}, timestamp = {2020-08-31T11:43:03.000+0200}, title = {An Inductive-Coupling DC Voltage Transceiver for Highly Parallel Wafer-Level Testing.}, url = {http://dblp.uni-trier.de/db/journals/jssc/jssc45.html#YoshidaNNNMTMK10}, volume = 45, year = 2010 }