%0 Journal Article %1 journals/ieicet/KerLC05 %A Ker, Ming-Dou %A Lin, Kun-Hsien %A Chuang, Che-Hao %D 2005 %J IEICE Trans. Electron. %K dblp %N 3 %P 429-436 %T MOS-Bounded Diodes for On-Chip ESD Protection in Deep Submicron CMOS Process. %U http://dblp.uni-trier.de/db/journals/ieicet/ieicet88c.html#KerLC05 %V 88-C

@article{journals/ieicet/KerLC05, added-at = {2020-04-11T00:00:00.000+0200}, author = {Ker, Ming-Dou and Lin, Kun-Hsien and Chuang, Che-Hao}, biburl = {https://www.bibsonomy.org/bibtex/23411a733ab8401190705235d37f85d1d/dblp}, ee = {https://doi.org/10.1093/ietele/e88-c.3.429}, interhash = {915e7c4539a7ef21cb532aecb07795a1}, intrahash = {3411a733ab8401190705235d37f85d1d}, journal = {IEICE Trans. Electron.}, keywords = {dblp}, number = 3, pages = {429-436}, timestamp = {2020-04-14T11:50:02.000+0200}, title = {MOS-Bounded Diodes for On-Chip ESD Protection in Deep Submicron CMOS Process.}, url = {http://dblp.uni-trier.de/db/journals/ieicet/ieicet88c.html#KerLC05}, volume = {88-C}, year = 2005 }