%0 Journal Article %1 journals/mj/GargLLK19 %A Garg, Achiranshu %A Lee, Zhao Chuan %A Lu, Lu %A Kim, Tony Tae-Hyoung %D 2019 %J Microelectron. J. %K dblp %P 29-38 %T Improving uniformity and reliability of SRAM PUFs utilizing device aging phenomenon for unique identifier generation. %U http://dblp.uni-trier.de/db/journals/mj/mj90.html#GargLLK19 %V 90

@article{journals/mj/GargLLK19, added-at = {2021-08-03T00:00:00.000+0200}, author = {Garg, Achiranshu and Lee, Zhao Chuan and Lu, Lu and Kim, Tony Tae-Hyoung}, biburl = {https://www.bibsonomy.org/bibtex/258a7cc3e48e129207e25cd45c78623e0/dblp}, ee = {https://doi.org/10.1016/j.mejo.2019.05.013}, interhash = {930b4d11da25acf27afb749f9d658dcb}, intrahash = {58a7cc3e48e129207e25cd45c78623e0}, journal = {Microelectron. J.}, keywords = {dblp}, pages = {29-38}, timestamp = {2024-04-08T21:37:01.000+0200}, title = {Improving uniformity and reliability of SRAM PUFs utilizing device aging phenomenon for unique identifier generation.}, url = {http://dblp.uni-trier.de/db/journals/mj/mj90.html#GargLLK19}, volume = 90, year = 2019 }