%0 Conference Paper %1 conf/vts/MathewS92 %A Mathew, Ben %A Saab, Daniel G. %B VTS %D 1992 %I IEEE Computer Society %K dblp %P 107-112 %T Robust switch-level test generation. %U http://dblp.uni-trier.de/db/conf/vts/vts1992.html#MathewS92 %@ 0-7803-0623-6

@inproceedings{conf/vts/MathewS92, added-at = {2023-03-24T00:00:00.000+0100}, author = {Mathew, Ben and Saab, Daniel G.}, biburl = {https://www.bibsonomy.org/bibtex/251b7335820958d5594cb5cf6bf0fe8dc/dblp}, booktitle = {VTS}, crossref = {conf/vts/1992}, ee = {https://doi.ieeecomputersociety.org/10.1109/VTEST.1992.232733}, interhash = {93911264acff14189b3c3131e657bf1a}, intrahash = {51b7335820958d5594cb5cf6bf0fe8dc}, isbn = {0-7803-0623-6}, keywords = {dblp}, pages = {107-112}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T07:35:02.000+0200}, title = {Robust switch-level test generation.}, url = {http://dblp.uni-trier.de/db/conf/vts/vts1992.html#MathewS92}, year = 1992 }