%0 Journal Article %1 journals/mr/PazirandehWT10 %A Pazirandeh, Reza %A Würfl, Joachim %A Tränkle, Günther %D 2010 %J Microelectron. Reliab. %K dblp %N 6 %P 763-766 %T Determination of GaN HEMT reliability by monitoring IDSS. %U http://dblp.uni-trier.de/db/journals/mr/mr50.html#PazirandehWT10 %V 50

@article{journals/mr/PazirandehWT10, added-at = {2020-02-22T00:00:00.000+0100}, author = {Pazirandeh, Reza and Würfl, Joachim and Tränkle, Günther}, biburl = {https://www.bibsonomy.org/bibtex/2c31cb3a5c42c51a2eaf3160ebea6ad36/dblp}, ee = {https://doi.org/10.1016/j.microrel.2010.02.017}, interhash = {93a984f8fb0d27382a5f1432769409f1}, intrahash = {c31cb3a5c42c51a2eaf3160ebea6ad36}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = 6, pages = {763-766}, timestamp = {2020-02-25T13:24:30.000+0100}, title = {Determination of GaN HEMT reliability by monitoring IDSS.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr50.html#PazirandehWT10}, volume = 50, year = 2010 }