%0 Conference Paper %1 conf/dft/WagnerK95 %A Wagner, Israel A. %A Koren, Israel %B DFT %D 1995 %I IEEE Computer Society %K dblp %P 46-54 %T The effect of spot defects on the parametric yield of long interconnection lines. %U http://dblp.uni-trier.de/db/conf/dft/dft1995.html#WagnerK95 %@ 0-8186-7107-6

@inproceedings{conf/dft/WagnerK95, added-at = {2023-03-24T00:00:00.000+0100}, author = {Wagner, Israel A. and Koren, Israel}, biburl = {https://www.bibsonomy.org/bibtex/2e52fd436184100a3dffc7b9ece90236c/dblp}, booktitle = {DFT}, crossref = {conf/dft/1995}, ee = {https://doi.ieeecomputersociety.org/10.1109/DFTVS.1995.476936}, interhash = {985b29b5760a892d01701ea85be3a807}, intrahash = {e52fd436184100a3dffc7b9ece90236c}, isbn = {0-8186-7107-6}, keywords = {dblp}, pages = {46-54}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T20:00:51.000+0200}, title = {The effect of spot defects on the parametric yield of long interconnection lines.}, url = {http://dblp.uni-trier.de/db/conf/dft/dft1995.html#WagnerK95}, year = 1995 }