%0 Journal Article %1 journals/mr/KraemerW15 %A Kraemer, Frank %A Wiese, Steffen %D 2015 %J Microelectron. Reliab. %K dblp %N 5 %P 716-721 %T Assessment of long term reliability of photovoltaic glass-glass modules vs. glass-back sheet modules subjected to temperature cycles by FE-analysis. %U http://dblp.uni-trier.de/db/journals/mr/mr55.html#KraemerW15 %V 55

@article{journals/mr/KraemerW15, added-at = {2022-10-02T00:00:00.000+0200}, author = {Kraemer, Frank and Wiese, Steffen}, biburl = {https://www.bibsonomy.org/bibtex/29b0056a5e790bc8773fcc00e11f5e75e/dblp}, ee = {https://doi.org/10.1016/j.microrel.2015.02.007}, interhash = {98974449b465eab623c1eb3d1ba32851}, intrahash = {9b0056a5e790bc8773fcc00e11f5e75e}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = 5, pages = {716-721}, timestamp = {2024-04-09T02:49:28.000+0200}, title = {Assessment of long term reliability of photovoltaic glass-glass modules vs. glass-back sheet modules subjected to temperature cycles by FE-analysis.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr55.html#KraemerW15}, volume = 55, year = 2015 }