%0 Journal Article %1 journals/mr/KarboyanTRBCMLCLMRTBM13 %A Karboyan, S. %A Tartarin, Jean-Guy %A Rzin, M. %A Brunel, Laurent %A Curutchet, Arnaud %A Malbert, Nathalie %A Labat, Nathalie %A Carisetti, D. %A Lambert, Benoit %A Mermoux, M. %A Romain-Latu, E. %A Thomas, F. %A Bouexière, C. %A Moreau, C. %D 2013 %J Microelectron. Reliab. %K dblp %N 9-11 %P 1491-1495 %T Influence of gate leakage current on AlGaN/GaN HEMTs evidenced by low frequency noise and pulsed electrical measurements. %U http://dblp.uni-trier.de/db/journals/mr/mr53.html#KarboyanTRBCMLCLMRTBM13 %V 53

@article{journals/mr/KarboyanTRBCMLCLMRTBM13, added-at = {2020-04-16T00:00:00.000+0200}, author = {Karboyan, S. and Tartarin, Jean-Guy and Rzin, M. and Brunel, Laurent and Curutchet, Arnaud and Malbert, Nathalie and Labat, Nathalie and Carisetti, D. and Lambert, Benoit and Mermoux, M. and Romain-Latu, E. and Thomas, F. and Bouexière, C. and Moreau, C.}, biburl = {https://www.bibsonomy.org/bibtex/2218b312b0cda3b67ed65e76ce26e5a8a/dblp}, ee = {https://doi.org/10.1016/j.microrel.2013.07.020}, interhash = {99a771a7cf2b6a4d3bb0bb76be35e6e8}, intrahash = {218b312b0cda3b67ed65e76ce26e5a8a}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = {9-11}, pages = {1491-1495}, timestamp = {2020-04-17T12:00:46.000+0200}, title = {Influence of gate leakage current on AlGaN/GaN HEMTs evidenced by low frequency noise and pulsed electrical measurements.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr53.html#KarboyanTRBCMLCLMRTBM13}, volume = 53, year = 2013 }