%0 Conference Paper %1 conf/iscas/TehranipourNF01 %A Tehranipour, Mohammad H. %A Navabi, Zainalabedin %A Fakhraie, Seid Mehdi %B ISCAS (5) %D 2001 %I IEEE %K dblp %P 73-76 %T An efficient BIST method for testing of embedded SRAMs. %U http://dblp.uni-trier.de/db/conf/iscas/iscas2001-5.html#TehranipourNF01 %@ 0-7803-6685-9

@inproceedings{conf/iscas/TehranipourNF01, added-at = {2016-05-20T00:00:00.000+0200}, author = {Tehranipour, Mohammad H. and Navabi, Zainalabedin and Fakhraie, Seid Mehdi}, biburl = {https://www.bibsonomy.org/bibtex/25e92a4b22e5333620c0553cfdde7a768/dblp}, booktitle = {ISCAS (5)}, crossref = {conf/iscas/2001}, ee = {http://dx.doi.org/10.1109/ISCAS.2001.921988}, interhash = {9dc10ebceed4561257bc66b7114686d5}, intrahash = {5e92a4b22e5333620c0553cfdde7a768}, isbn = {0-7803-6685-9}, keywords = {dblp}, pages = {73-76}, publisher = {IEEE}, timestamp = {2016-05-21T11:49:07.000+0200}, title = {An efficient BIST method for testing of embedded SRAMs.}, url = {http://dblp.uni-trier.de/db/conf/iscas/iscas2001-5.html#TehranipourNF01}, year = 2001 }