%0 Journal Article %1 journals/jssc/ZargariLWW99 %A Zargari, Masoud %A Leung, Justin %A Wong, S. Simon %A Wooley, Bruce A. %D 1999 %J IEEE J. Solid State Circuits %K dblp %N 8 %P 1118-1135 %T A BiCMOS active substrate probe-card technology for digital testing. %U http://dblp.uni-trier.de/db/journals/jssc/jssc34.html#ZargariLWW99 %V 34

@article{journals/jssc/ZargariLWW99, added-at = {2022-07-05T00:00:00.000+0200}, author = {Zargari, Masoud and Leung, Justin and Wong, S. Simon and Wooley, Bruce A.}, biburl = {https://www.bibsonomy.org/bibtex/2a382e9280e26b99179036d72b8f27db7/dblp}, ee = {https://doi.org/10.1109/4.777110}, interhash = {9deec1ef07d89a8f88f723b8188bb821}, intrahash = {a382e9280e26b99179036d72b8f27db7}, journal = {IEEE J. Solid State Circuits}, keywords = {dblp}, number = 8, pages = {1118-1135}, timestamp = {2024-04-08T10:42:32.000+0200}, title = {A BiCMOS active substrate probe-card technology for digital testing.}, url = {http://dblp.uni-trier.de/db/journals/jssc/jssc34.html#ZargariLWW99}, volume = 34, year = 1999 }