%0 Journal Article %1 journals/mr/WuHHLZH02 %A Wu, J. D. %A Ho, S. H. %A Huang, C. Y. %A Liao, C. C. %A Zheng, P. J. %A Hung, S. C. %D 2002 %J Microelectron. Reliab. %K dblp %N 3 %P 407-416 %T Board level reliability of a stacked CSP subjected to cyclic bending. %U http://dblp.uni-trier.de/db/journals/mr/mr42.html#WuHHLZH02 %V 42

@article{journals/mr/WuHHLZH02, added-at = {2020-02-22T00:00:00.000+0100}, author = {Wu, J. D. and Ho, S. H. and Huang, C. Y. and Liao, C. C. and Zheng, P. J. and Hung, S. C.}, biburl = {https://www.bibsonomy.org/bibtex/2de25e87fb764daca005cc75755186fa2/dblp}, ee = {https://doi.org/10.1016/S0026-2714(01)00241-4}, interhash = {a05bb14d54ebef9f0d2d6ea9beaa2414}, intrahash = {de25e87fb764daca005cc75755186fa2}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = 3, pages = {407-416}, timestamp = {2020-02-25T13:29:10.000+0100}, title = {Board level reliability of a stacked CSP subjected to cyclic bending.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr42.html#WuHHLZH02}, volume = 42, year = 2002 }