%0 Journal Article %1 journals/ieicet/KimLK13 %A Kim, Incheol %A Lee, Ingeol %A Kang, Sungho %D 2013 %J IEICE Trans. Electron. %K dblp %N 2 %P 292-294 %T Built-In Self-Test for Static ADC Testing with a Triangle-Wave. %U http://dblp.uni-trier.de/db/journals/ieicet/ieicet96c.html#KimLK13 %V 96-C

@article{journals/ieicet/KimLK13, added-at = {2020-04-11T00:00:00.000+0200}, author = {Kim, Incheol and Lee, Ingeol and Kang, Sungho}, biburl = {https://www.bibsonomy.org/bibtex/23623d6e211ac8e4643b8d69c6c594b74/dblp}, ee = {http://search.ieice.org/bin/summary.php?id=e96-c_2_292}, interhash = {a09f99faec1de5a372fc381bb5ea0a77}, intrahash = {3623d6e211ac8e4643b8d69c6c594b74}, journal = {IEICE Trans. Electron.}, keywords = {dblp}, number = 2, pages = {292-294}, timestamp = {2020-04-14T12:02:17.000+0200}, title = {Built-In Self-Test for Static ADC Testing with a Triangle-Wave.}, url = {http://dblp.uni-trier.de/db/journals/ieicet/ieicet96c.html#KimLK13}, volume = {96-C}, year = 2013 }