Please log in to take part in the discussion (add own reviews or comments).
Cite this publication
More citation styles
- please select -
%0 Conference Paper
%1 kmbs_ulis05
%A K. Samsudin,
%A Cheng, B.
%A Brown, A. R.
%A Roy, S.
%A Asenov, A.
%B 6th European Conference on Ultimate Integration of Silicon (ULIS)
%C Bologna, Italy
%D 2005
%K circuit
%P 45-48
%T Impact of Body Thickness Fluctuation in Nanometre Scale UTB SOI
MOSFETs on SRAM Cell Functionality
@inproceedings{kmbs_ulis05,
added-at = {2008-01-06T05:43:41.000+0100},
address = {Bologna, Italy},
author = {{\bf K. Samsudin} and Cheng, B. and Brown, A. R. and Roy, S. and Asenov, A.},
biburl = {https://www.bibsonomy.org/bibtex/2c7bd48d044d0259590837d71d8338d5f/kmbs},
booktitle = {6th European Conference on Ultimate Integration of Silicon (ULIS)},
date-modified = {2006-02-11 18:19:02 +0000},
description = {KMBS BibTex entry},
interhash = {a1d02b4124943c67a92153d555a2f29c},
intrahash = {c7bd48d044d0259590837d71d8338d5f},
keywords = {circuit},
local-url = {file://localhost/Users/kmbs/Project/Papers/Samsudin/2005b.pdf},
month = {April},
pages = {45-48},
timestamp = {2008-01-06T05:43:42.000+0100},
title = {Impact of Body Thickness Fluctuation in Nanometre Scale {UTB} {SOI}
{MOSFET}s on {SRAM} Cell Functionality},
year = 2005
}