%0 Conference Paper %1 conf/ats/Pomeranz01 %A Pomeranz, Irith %B Asian Test Symposium %D 2001 %I IEEE Computer Society %K dblp %P 51-56 %T On Pass/Fail Dictionaries for Scan Circuits . %U http://dblp.uni-trier.de/db/conf/ats/ats2001.html#Pomeranz01 %@ 0-7695-1378-6

@inproceedings{conf/ats/Pomeranz01, added-at = {2023-03-24T00:00:00.000+0100}, author = {Pomeranz, Irith}, biburl = {https://www.bibsonomy.org/bibtex/2e8f1a97e31deb41ab1f0344636fd79c4/dblp}, booktitle = {Asian Test Symposium}, crossref = {conf/ats/2001}, ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.2001.990258}, interhash = {a3ed63c9a58996ff51072d4af53b1f29}, intrahash = {e8f1a97e31deb41ab1f0344636fd79c4}, isbn = {0-7695-1378-6}, keywords = {dblp}, pages = {51-56}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T06:35:48.000+0200}, title = {On Pass/Fail Dictionaries for Scan Circuits .}, url = {http://dblp.uni-trier.de/db/conf/ats/ats2001.html#Pomeranz01}, year = 2001 }