%0 Conference Paper %1 conf/date/IchiharaI03 %A Ichihara, Hideyuki %A Inoue, Tomoo %B DATE %D 2003 %I IEEE Computer Society %K dblp %P 11180-11181 %T Test Generation for Acyclic Sequential Circuits with Single Stuck-at Fault Combinational ATPG. %U http://dblp.uni-trier.de/db/conf/date/date2003.html#IchiharaI03 %@ 0-7695-1870-2

@inproceedings{conf/date/IchiharaI03, added-at = {2023-03-24T00:00:00.000+0100}, author = {Ichihara, Hideyuki and Inoue, Tomoo}, biburl = {https://www.bibsonomy.org/bibtex/29471ef44e4e346158d93676c620697ab/dblp}, booktitle = {DATE}, crossref = {conf/date/2003}, ee = {http://dl.acm.org/citation.cfm?id=1022909}, interhash = {a439ec7759d0fdaf0007b0146ae1e851}, intrahash = {9471ef44e4e346158d93676c620697ab}, isbn = {0-7695-1870-2}, keywords = {dblp}, pages = {11180-11181}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T06:54:02.000+0200}, title = {Test Generation for Acyclic Sequential Circuits with Single Stuck-at Fault Combinational ATPG.}, url = {http://dblp.uni-trier.de/db/conf/date/date2003.html#IchiharaI03}, year = 2003 }